Risk factors for paternal perinatal depression in Chinese advanced maternal age couples: A regression mixture model

doi:10.5498/wjp.v16.i1.112057

Advanced Search

BPG is committed to discovery and dissemination of knowledge

Home / Archive / Volume 16, Issue 1

This Article

(35)

(34)

(0)

(770)

Peer-Review Report of This Article

CrossCheck and Google Search of This Article

Academic Rules and Norms of This Article

Citation of this article

Corresponding Author of This Article

Research Domain of This Article

Article-Type of This Article

Open-Access Policy of This Article

Times Cited Counts in Google of This Article

Journal Information of This Article

Publication Name

World Journal of Psychiatry

ISSN

2220-3206

Publisher of This Article

Baishideng Publishing Group Inc, 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA

Observational Study

World J Psychiatry. Jan 19, 2026; 16(1): 112057
Published online Jan 19, 2026. doi: 10.5498/wjp.v16.i1.112057

Table 2 Model fit results from the latent profile analysis

Components	AIC	BIC	aBIC	ETRO	LMR	BLRT	Categorical probability
1	8216.104	8293.714	8230.265
2	7515.139	7635.435	7537.088	0.910	< 0.001	< 0.001	0.55/0.45
3	7243.134	7406.116	7272.872	0.929	0.001	< 0.001	0.39/0.49/0.12
4	7115.949	7321.617	7153.476	0.953	0.610	< 0.001	0.11/0.32/0.44/0.13

AIC: Akaike information criterion; BIC: Bayesian information criterion; aBIC: Corrected Bayesian information criterion; ETRO: Entropy, LMR: Lo-Mendell-Rubin likelihood ratio test; BLRT: Bootstrap likelihood ratio test.

Full Size Table

Citation: Yin X, Du J, Cai SL, Chen XQ. Risk factors for paternal perinatal depression in Chinese advanced maternal age couples: A regression mixture model. World J Psychiatry 2026; 16(1): 112057
URL: https://www.wjgnet.com/2220-3206/full/v16/i1/112057.htm
DOI: https://dx.doi.org/10.5498/wjp.v16.i1.112057

Yin X, Du J, Cai SL, Chen XQ. Risk factors for paternal perinatal depression in Chinese advanced maternal age couples: A regression mixture model. World J Psychiatry 2026; 16(1): 112057 [PMID: 41607451 DOI: 10.5498/wjp.v16.i1.112057]

All content on this site: Copyright © 1993-2026 Baishideng Publishing Group Inc, its licensors, and contributors. All rights are reserved, including those for text and data mining, AI training, and similar technologies. For all open access content, the relevant licensing terms apply.