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Cited by in F6Publishing
For: Kizjak A, Evtukh A, Bratus O, Antonin S, Ievtukh V, Pylypova O, Fedotov A. Electron transport through composite SiO2(Si)&FexOy(Fe) thin films containing Si and Fe nanoclusters. Journal of Alloys and Compounds 2022;903:163892. [DOI: 10.1016/j.jallcom.2022.163892] [Cited by in Crossref: 1] [Cited by in F6Publishing: 1] [Article Influence: 1.0] [Reference Citation Analysis]
Number Citing Articles
1 Pal S, Dalui TK, Basak D. Unravelling the crossover amongst band and various hopping conduction mechanisms in Mo doped ZnO thin films owing to carrier localization at defects. Journal of Alloys and Compounds 2023. [DOI: 10.1016/j.jallcom.2023.169335] [Reference Citation Analysis]
2 Pylypova O, Antonin S, Fedorenko L, Muryi Y, Skryshevsky V, Evtukh A. Influence of Laser Annealing of Silicon Enriched SiOx Films on their Electrical Conductivity. Silicon. [DOI: 10.1007/s12633-022-01959-2] [Reference Citation Analysis]
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